Position measuring apparatus
AssigneeFujitsu Limited
InventorsHironori Yokoi, Toshio Endoh
Life of this patent
Estimating the term…
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AssigneeFujitsu Limited
InventorsHironori Yokoi, Toshio Endoh
Estimating the term…
A position measuring apparatus including a first irradiating part that irradiates a first beam to an object, a second irradiating part that irradiates a second beam to the object, a capturing part that captures images of the object, a processing part that generates a first difference image and a second difference image by processing the images captured by the capturing part, an extracting part that extracts a contour and a feature point of the object from the first difference image, a calculating part that calculates three-dimensional coordinates of a reflection point located on the object based on the second difference image, and a determining part that determines a position of the object by matching the contour, the feature point, and the three-dimensional coordinates with respect to predetermined modeled data of the object.
A position measuring apparatus comprising:
A position measuring method comprising:
Dependencies are inferred from the claim text.