Determining chip separation by comparing coupling capacitances

A method for determining a separation between a first semiconductor die and a second semiconductor die, comprising:

• selecting a first group of proximity connectors in the first semiconductor die, wherein the first group of proximity connectors have a first area;
• and wherein the first group of proximity connectors includes one or more proximity connectors that are used to communicate signals with the second semiconductor die;
• measuring a sign of a difference in capacitance between the first group of proximity connectors and a second group of proximity connectors in the second semiconductor die, wherein the second group of proximity connectors includes one or more proximity connectors that are used to communicate signals with the first semiconductor die;
• and
• determining the separation by selecting different groups of proximity connectors that have areas that are different than the first area until the sign of the difference in capacitance changes polarity, wherein the different groups of proximity connectors include one or more proximity connectors.