Semiconductor device and method of manufacturing the same
AssigneePanasonic Corporation
InventorsTsutomu OOSUKA, Yoshihiro Sato, Hisashi Ogawa
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AssigneePanasonic Corporation
InventorsTsutomu OOSUKA, Yoshihiro Sato, Hisashi Ogawa
Estimating the term…
A first and second gate electrodes are formed on a first and second active regions, respectively. The first and second gate electrodes have a first and second metal-containing conductive films, respectively. The first and second metal-containing conductive films are formed on the isolation region for segmenting the first and second active regions to be spaced apart from each other. A third metal-containing conductive film, which is a part of each of the first and second gate electrodes, is continuously formed from a top of the first metal-containing conductive film through a top of the isolation region to a top of the second metal-containing conductive film. The third metal-containing conductive film is in contact with the first and second metal-containing conductive films.
A semiconductor device comprising:
A method of manufacturing a semiconductor device comprising:
Dependencies are inferred from the claim text.