Back to results
US 2009/0290785 A1Published application
Apparatus and method for inspecting liquid crystal display
AssigneeLG Displays Co., Ltd.
InventorsDong Woo Kang, Soung Yeoul Eom, Bong Chul Kim, Ki Soub Yang
Life of this patent
Estimating the term…
Abstract
A liquid crystal display (LCD) inspection apparatus and method are provided. The inspection apparatus and method are capable of automatically and accurately detecting defects of an LCD panel, and providing information of the automatically-detected defects of the LCD panel to the operator, thereby enabling the operator to easily recognize the defects.
Claims9
A liquid crystal display (LCD) inspection apparatus comprising:
- an inspector that photographs images of various patterns displayed on an LCD panel;
- an image processor that receives the images photographed by the inspector, extracts defect information from the received images, and converts the extracted defect information to corresponding data;
- a pattern generator that receives the data from the image processor, sorts the received data, and displays the sorted data;
- a first illumination unit that is arranged between the first polarizing plate and the worktable, and is adapted to irradiate illumination light from the periphery of the LCD panel at a position forwardly spaced apart from the LCD panel toward a front surface of the LCD panel;
- and
- a second illumination unit that is arranged between the second polarizing plate and the worktable, and is adapted to irradiate illumination light from the periphery of the LCD panel at a position rearwardly spaced apart from the LCD panel toward a back surface of the LCD panel, wherein a foreign matter identification step for photographing an image of the LCD panel is accomplished in a state in which illumination light is irradiated to a front surface and/or a rear surface of the LCD panel using the first and second illumination units under a condition in which light emitted from a backlight unit toward the LCD panel is shut off,
- wherein the image processor deletes extract information about coordinates of foreign matter from the image photographed at the foreign matter identification step when extracting defect information, thereby extracting defect information alone.
4 more elements
Dependencies are inferred from the claim text.