Semiconductor Device and Semiconductor Device Manufacturing Method
AssigneeRohm Co., Ltd.
InventorsYasumasa Kasuya, Sadamasa Fujii
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AssigneeRohm Co., Ltd.
InventorsYasumasa Kasuya, Sadamasa Fujii
Estimating the term…
In an inventive semiconductor device production method, a one-side metal layer is first formed in a region located across a predetermined section line on one surface of a substrate. Further, an other-side metal layer is formed on the other surface of the substrate in a position opposed to the one-side metal layer. In turn, a continuous through-hole extending continuously through the other-side metal layer and the substrate is formed in a position located across the section line. Thereafter, a metal plating layer is formed on a surface of the other-side metal layer, an inner surface of the continuous through-hole and a portion of the one-side metal layer exposed to the continuous through-hole. Before the resulting substrate is cut into separate support boards, a portion of the other-side metal layer present on the section line and a portion of the metal plating layer present on this other-side metal layer portion are removed.
A semiconductor device comprising:
A method of producing a semiconductor device including a semiconductor chip and a support board which supports the semiconductor chip, the method comprising the steps of:
A method of producing a semiconductor device including a semiconductor chip and a support board which supports the semiconductor chip, the method comprising the steps of:
A semiconductor device comprising:
A method of producing a semiconductor device including a semiconductor chip and a support board which supports the semiconductor chip, the method comprising the steps of:
A method of producing a semiconductor device including a semiconductor chip and a support board which supports the semiconductor chip, the method comprising the steps of:
Dependencies are inferred from the claim text.