Electronic apparatus and bit error rate tolerance method for programming non-volatile memory devices

A device programmer apparatus for programming a non-volatile memory device, the apparatus comprising:

• means for storing data to be transferred into memory of a non-volatile memory device;
• means for transferring data into memory of the non-volatile memory device;
• means for analyzing a memory region of the non-volatile memory device that stores the transferred data to find the number of bit errors contained in the memory region without running an error correcting code algorithm;
• means for comparing the number of bit errors found in the analyzed memory region of the non-volatile memory device to a tolerance value representing a maximum number of bit errors that a memory region in the memory device can tolerate;
• and
• means for rejecting the non-volatile memory device if the number of bit errors found in the analyzed memory region of the non-volatile memory device is greater than the tolerance value.

A computer readable medium with computer-executable code comprising:

• code for receiving a tolerance value representing a maximum number of bit errors that a memory region in a non-volatile memory device can tolerate;
• code for analyzing a memory region of the non-volatile memory device to find the number of bit errors contained in the memory region of the device without running an error correcting code algorithm;
• code for comparing the number of bit errors found in the analyzed memory region of the non-volatile memory device to the tolerance value;
• and
• code for rejecting the non-volatile memory device if the number of bit errors found in the analyzed memory region of the non-volatile memory device is greater than the tolerance value.