Computer-based methods and systems for failure analysis
AssigneeHamamatsu Photonics K.K.
InventorsTakayuki Iida, Stanley Sangjin Kim, Roberta E. Benson
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AssigneeHamamatsu Photonics K.K.
InventorsTakayuki Iida, Stanley Sangjin Kim, Roberta E. Benson
Estimating the term…
In accordance with one aspect, the invention provides a method of performing failure analysis on a microelectronic product where the method includes acts of: storing a result of a first test performed on the microelectronic product on a centralized computer; transmitting the result from the centralized computer to a first remote computer for an evaluation of the result by a first evaluator; and transmitting a report form from the centralized computer to the first remote computer for entry of data including analysis supplied by the first evaluator after the evaluation of the result. In accordance with one embodiment, the method also provides acts of: receiving the data at the centralized computer; and storing the data at the centralized computer. In accordance with another embodiment, the method further includes an act of transmitting the result from the centralized computer to a second remote computer for an evaluation of the result by a second evaluator for entry of data including analysis supplied by the second evaluator after the evaluation of the result by the second evaluator.
A method of performing failure analysis on a microelectronic product, the method comprising acts of:
A computer-based system for performing failure analysis on a microelectronic product, the system comprising:
A method of performing failure analysis on a microelectronic product, the method comprising acts of:
Dependencies are inferred from the claim text.