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AssigneeFujitsu Limited
InventorsMasanori Yaguchi, Mutsuo Yoshinami, WooSuk Song
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The method for testing a characteristic of a magnetic head is performed in the form of a wafer, especially in a heating state and a cooling state. The method for testing a characteristic of a magnetic head, in which a wafer including a dummy read-element having a size equal to that of a completed read-element, a product read-element and a heat conductive section being provided in the vicinity of the dummy read-element is tested as a test sample, comprises the steps of: applying an external magnetic field to the test sample; bringing a heat conducting member into contact with the heat conductive section so as to heat or cool the dummy read-element via the heat conductive section; and testing an electromagnetic conversion characteristic of the dummy read-element in a heating state or a cooling state.
A method for testing a characteristic of a magnetic head, in which a wafer including a dummy read-element to be tested having a size equal to that of a completed read-element, a product read-element to be actually used in the magnetic head and a heat conductive section being provided in the vicinity of the dummy read-element is tested as a test sample, comprising the steps of:
An apparatus for testing a characteristic of a magnetic head,
A wafer for producing a magnetic head,
Dependencies are inferred from the claim text.