Optical equipment
AssigneeOlympus Corporation
InventorHirofumi TAKATSUKA
Life of this patent
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Abstract
Optical equipment for detecting beams emitted from a sample by irradiating the sample with linear polarization according to an aspect of the present invention includes a wavelength-independent optical path division element arranged at a position of coupling of a illumination optical path of the linear polarization and a detection optical path of the beams, and the linear polarization is reflected by the interface of the optical path division element entered as S polarization and led to the sample, and the beams pass through the optical path division element and are detected.
Claims12
Optical equipment which detects beams emitted from a sample by irradiating the sample with linear polarization comprising:
- a wavelength-independent optical path division element arranged at a position of coupling of a illumination optical path of the linear polarization and a detection optical path of the beams, wherein
- the linear polarization is reflected by the interface of the optical path division element entered as S polarization and led to the sample;
- and
- the beams pass through the optical path division element and are detected.
Dependencies are inferred from the claim text.