Optical Characteristic Measuring Apparatus and Optical Characteristics Measuring Method
AssigneeNational University Corporation Tokyo University of Agriculture and Technology
InventorsYukitoshi Otani, Toshitaka Wakayama
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Abstract
An optical characteristic measuring apparatus includes an optical system 10 including first and second carrier retarders 24 and 32 having the retardations being known and differing from each other. The optical characteristic measuring apparatus performs: a spectrum extraction process of extracting a plurality of spectral peaks from a frequency spectrum obtained by analyzing a light intensity signal detected by light-receiving/spectroscopic means; and an optical characteristic element calculation process of calculating an optical characteristic element representing optical characteristics of a measurement target based on the spectral peaks and the retardations of the first and second carrier retarders.
Claims10
An optical characteristic measuring apparatus for measuring optical characteristics of a measurement target, the optical characteristic measuring apparatus comprising:
- an optical system including first and second carrier retarders formed by high-order retardation plates and having retardations being known and differing from each other, the optical system causing light including a predetermined band component to be incident on the measurement target through a first polarizer and the first carrier retarder and causing the light modulated by the measurement target to be incident on light-receiving/spectroscopic means through the second carrier retarder and a second polarizer;
- and
- calculation means for performing a spectrum extraction process of extracting a plurality of spectral peaks from a frequency spectrum obtained by analyzing a light intensity signal detected by the light-receiving/spectroscopic means, and an optical characteristic element calculation process of calculating an optical characteristic element representing the optical characteristics of the measurement target based on the spectral peaks and the retardations of the first and second carrier retarders.
An optical characteristic measuring method for measuring optical characteristics of a measurement target, the optical characteristic measuring method comprising:
- a process of using first and second carrier retarders formed by high-order retardation plates causing light including a predetermined band component to be incident on the measurement target through a first polarizer and a first carrier retarder and causing the light modulated by the measurement target to be incident on light-receiving/spectroscopic means through a second carrier retarder and a second polarizes, retardations of the first and second carrier retarders being known and differing from each other;
- a spectrum extraction process of extracting a plurality of spectral peaks from a frequency spectrum obtained by analyzing a light intensity signal detected by the light-receiving/spectroscopic means;
- and
- a calculation process of performing an optical characteristic element calculation process of calculating an optical characteristic element representing the optical characteristics of the measurement target, based on the extracted spectral peaks and the retardations of the first and second carrier retarders.
Dependencies are inferred from the claim text.