Device test and debug using power and ground terminals
AssigneeTexas Instruments Incorporated
InventorLee D. Whetsel
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Abstract
The present disclosure describes a novel method and apparatus for using a device's power and ground terminals as a test and/or debug interface for the device. According to the present disclosure, messages are modulated over DC voltages applied to the power terminals of a device to input test/debug messages to the device and output test/debug messages from the device. The present disclosure advantageously allows a device to be tested and/or debugged without the device having any shared or dedicated test or debug interface terminals.
Claims1
A process of testing an integrated circuit having functional circuitry and test circuitry connected to the functional circuitry, the test circuitry having test input leads receiving test signals for testing the functional circuitry and a test output lead for sending response signals from the testing, the integrated circuit having power and ground leads, comprising:
- A. receiving test response signals from the test output lead;
- B. formatting the test response signals;
- C. modulating the formatted test response signals;
- and
- D. applying the modulated and formatted test control signals to a power lead of the integrated circuit.
Dependencies are inferred from the claim text.