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US 2009/0212208 A1Published application
Method and Apparatus for Time-of-Flight Mass Spectrometry
AssigneeJEOL Ltd.
InventorsTakaya Sato, Michisato Toyoda, Morio Ishihara
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Abstract
A method and apparatus for time-of-flight (TOF) mass spectrometry. The apparatus improves the ion focusing properties in an orthogonal direction and permits connection with an orthogonal-acceleration ion source for improvement of sensitivity. The apparatus comprises an ion source for emitting ions in a pulsed manner, an analyzer for realizing a helical trajectory, and a detector for detecting the ions. The analyzer is composed of plural laminated toroidal electric fields to realize the helical trajectory.
Claims12
A time-of-flight mass spectrometer comprising:
- an ion source for ionizing a sample;
- means for accelerating the ions in a pulsed manner;
- a helical-trajectory time-of-flight mass analyzer which is composed of plural electric sector fields and in which the ions are made to travel in a helical trajectory;
- an ion gate for selecting ions having a certain mass out of ions passed through the helical-trajectory time-of-flight mass analyzer;
- means for fragmenting the selected ions;
- a reflectron time-of-flight mass analyzer including a reflectron electric field;
- and
- a detector for detecting the ions passed through the reflectron time-of-flight mass analyzer.
5 more elements
A time-of-flight mass spectrometer comprising:
- an ion source for ionizing a sample;
- means for transporting the ions;
- means for accelerating the ions in a pulsed manner in a direction orthogonal to a direction in which the ions are transported;
- a helical-trajectory time-of-flight mass analyzer which is composed of plural electric sector fields and in which the ions are made to travel in a helical trajectory;
- an ion gate for selecting ions having a certain mass out of ions passed through the helical-trajectory time-of-flight mass analyzer;
- means for fragmenting the selected ions;
- a reflectron time-of-flight mass analyzer including a reflectron electric field;
- and
- detection means for detecting the ions passed through the reflectron time-of-flight mass analyzer.
6 more elements
Dependencies are inferred from the claim text.