Method of improving signal-to-noise for quantitation by mass spectrometry
AssigneeApplera Corporation and MDS Analytical Technologies
InventorsBruce A. Thomson, Yves Le Blanc
Life of this patent
Estimating the term…
Loading patent…
AssigneeApplera Corporation and MDS Analytical Technologies
InventorsBruce A. Thomson, Yves Le Blanc
Estimating the term…
Selectivity of a measurement from a mass spectrometer is improved by selecting an extracted ion current window for the measurement after data acquisition. A plurality of mass spectra are acquired over a period of time. A first extracted ion current window is selected and from the plurality of mass spectra a first intensity as a function of time is calculated for an ion using the first extracted ion current window. A second extracted ion current window is selected and from the plurality of mass spectra a second intensity as a function of time is calculated for the ion using the second extracted ion current window. A first signal-to-noise ratio of the first intensity is compared with a second signal-to-noise ratio of the second intensity. If the second signal-to-noise ratio is greater than the first signal-to-noise ratio, the second intensity as a function of time is used for the measurement.
A method for improving selectivity of a measurement from a mass spectrometer, comprising:
A method for determining an extracted ion current window to use for a mass spectrometer measurement, comprising:
A mass spectrometry system, comprising:
A computer-readable medium whose contents cause a processor to perform a method for improving selectivity of a measurement from a mass spectrometer, the contents comprising:
Dependencies are inferred from the claim text.