Methods, devices, and systems for experiencing reduced unequal testing degradation
AssigneeMicron Technology, Inc.
InventorsBryce Cook, Nick Labrum
Life of this patent
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Abstract
One or more embodiments of the present invention reduce uneven degradation during testing by providing for a toggling signal to be applied to remaining input paths which do not receive test signals. Therefore, rather than being held in a fixed state during the burn-in process, the remaining inputs are toggled as well. Consequently, they degrade at a more similar rate as their counterpart inputs that did receive test signals.
Claims25
A method for reducing unequal degradation during testing of a device having a first set of externally-accessible terminals coupled to an array of memory cells through respective input paths and at least one second externally-accessible terminal which is coupleable to the array through a respective input path, the method comprising:
- applying a test signal to each of the first set of externally accessible input terminals;
- wherein, the test signal is transmitted from each of the externally-accessible terminals in the first set to the array through the respective input paths corresponding to the first set of externally accessible input terminals;
- decoupling the at least one second externally-accessible terminal from the array;
- and
- applying a toggling signal to the at least one remaining input path corresponding to the at least one second externally-accessible terminal during the testing.
A device configured for experiencing reduced unequal testing degradation, the device comprising:
- an array of memory cells;
- a first externally-accessible terminal receiving a test signal;
- a first input path coupling the test signal to the array of memory cells;
- a second externally-accessible terminal;
- a second input path coupling the second externally accessible terminal to the array of memory cells during normal operation and decoupled from the array of memory cells during testing;
- and
- switching circuitry coupling a toggling signal to the second input path during the testing.
A system for improved testing of a device, the system comprising:
- a test unit generating burn-in test signals;
- a toggling signal generator creating a toggling signal;
- a control signal generator creating a test mode signal indicative of burn-in testing;
- and
- the device comprising:
- an array of memory cells;
- a first externally-accessible terminal receiving the burn-in test signals;
- a first input path coupling the burn-in test signals to the array of memory cells;
- a second externally-accessible terminal;
- a second input path coupling the second externally accessible terminal to the array of memory cells during normal operation and decoupled from the array of memory cells during the burn-in testing;
- and
- switching circuitry coupling the toggling input signal to the second input path during the burn-in testing.
Dependencies are inferred from the claim text.