Jitter applying circuit and test apparatus

A test apparatus for testing a device under test, the test apparatus comprising:

• a pattern generator that generates a test pattern for testing the device under test;
• a jitter applying circuit that applies jitter to the test pattern;
• and
• a signal supply section that supplies a test signal that is in accordance with the test pattern to which the jitter has been applied, to the device under test, wherein
• the jitter applying circuit includes:
• a signal transmission path that transmits, from an input end to an output end thereof, the test pattern received from the pattern generator;
• a jitter control section that outputs, from an output terminal thereof, a jitter control voltage that is in accordance with jitter to be superposed to the test pattern propagating on the signal transmission path;
• and
• a variable capacitance diode that is provided between a connection point on the signal transmission path and the output terminal of the jitter control section, and whose capacitance changes in accordance with the jitter control voltage.