Measuring method and apparatus for potentiometric measuring probes
AssigneeMettler-Toledo AG
InventorChanglin WANG
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AssigneeMettler-Toledo AG
InventorChanglin WANG
Estimating the term…
A method and device are disclosed for measuring potentiometric measuring probes. An exemplary method includes feeding two test voltages comprising a harmonic wave Ueg with a base frequency fg and the harmonic wave Uer with a base frequency fr into two cores of a connecting cable through voltage source impedances, respectively. The voltage between an indicating electrode and a reference electrode, and the AC responding signal resulting from the two test voltages are passed to an amplifier and further to a transfer function unit having transfer functions (Hg, Hr), an A/D converter, and a Fourier transformation unit, to calculate a potential Ux and the two test responses Ug and Ur, respectively. Two calibration responses Uehg and Uehr are determined, wherein Uehg includes a product of Ueg and Hg, and wherein Uehr includes a product of Uer and Hr. Functional expressions are established for the test responses Ug and Ur, and the internal resistances Rg and Rr are determined by simultaneously solving equations having the unknown resistances Rg and Rr and capacitances C1 and C2. Accurate measurement of the internal resistance of the electrode can be achieved even with a relatively long connecting cable.
Method for observing the condition of a measuring device having a potentiometric measuring probe which comprises at least two electrodes, each having a resistance, the method comprising:
Device for observing the condition of a potentiometric measuring probe having at least two electrodes, each having an electrical resistance, at least one electrode being connected via a connecting cable to a voltage source configured for providing an alternating test voltage, the device comprising:
Dependencies are inferred from the claim text.