Method for analyzing reflection properties

A method of influencing/improving reflection properties of an artificially produced surface, which comprises:

• a) firstly determining a topology of the surface with a three-dimensional scanning method, to thereby establish topological data primarily including height values and depth values belonging to each surface element of a raster spanning the original surface, storing the topological data in a first data record, and assigning each surface element a measured depth value to form a depth map of the original surface;
• b) assessing the depth values of the first data record with regard to an influence thereof on the reflection properties;
• c) assigning a reflection value to each surface element based on the assessing step, and storing the reflection values in a second data record;
• d) dividing the reflection values of the second data record into classes;
• e) changing the depth values of the first data record, assigned to the classified reflection values, in accordance with the classification;
• and
• f) using the changed depth values as parameters for electronically controlling a tool in order to machine the artificially produced surface.