X-ray detection device for foreign matter
AssigneeAnritsu Industrial Solutions Co., Ltd.
InventorsToshihisa Watanabe, Hiroaki Kobayashi
Life of this patent
Estimating the term…
Abstract
An X-ray detection device for detecting whether or not foreign matter is mixed in on the basis of the transmission amount of X-rays that have penetrated an examination subject article by applying X-rays, at a predetermined detection position to an examination subject article being conveyed in a pipe (7), wherein a test-piece table (17) capable of passing by the detection position at substantially the same speed as that of the examination subject article is installed in the vicinity of the pipe (7), with a test-piece (21) placed thereon. X-ray detection sensitivity can be detected without mixing the test-piece in the actual examination subject article.
Claims7
An X-ray detection device for foreign matter (1, 40) which irradiates an examination subject article being conveyed in a conveyance path with X-rays at a predetermined detection position and which determines, on the basis of the transmission amount of X-rays that have penetrated through the examination subject article, whether or not foreign matter is mixed in, characterized in that the X-ray detection device comprises:
- a test-piece table (17, 49) which, being outside the conveyance path, holds a test piece (21) for checking sensitivity of detecting the mixed-in foreign matter and which is movably installed so that it can pass the detection position along a moving direction of the examination subject article moving in the conveyance path;
- and
- means (19, 43) for moving the test-piece table along the moving direction at substantially the same speed as a moving speed of the examination subject article.
Dependencies are inferred from the claim text.