Scanning microscope
AssigneeOlympus Corporation
InventorMitsuhiro NAKANO
Life of this patent
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AssigneeOlympus Corporation
InventorMitsuhiro NAKANO
Estimating the term…
A scanning microscope includes a source of illumination light; a scanner scanning the illumination light in a two-dimensional direction crossing a light axis; a lens irradiating the illumination light to a sample, and collecting return light from the sample; a focusing position adjuster adjusting a focal position in a light axis direction; and a light detector detecting collected light. A storage section stores the intensity of detected light, and positional information of an irradiating position of the illumination light set by the scanner and the focusing position adjuster. An image processor acquires images parallel to the light axis based on the intensity of return light and the stored positional information, and processes the images to detect a moving distance along a light axis direction of an area of the sample. The focusing position adjuster is controlled to correct a light condensing position of the illumination light.
A scanning microscope comprising:
Dependencies are inferred from the claim text.