Plate inspection system and plate inspection method
AssigneeDai Nippon Printing Co., Ltd.
InventorNorihisa Moriya
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AssigneeDai Nippon Printing Co., Ltd.
InventorNorihisa Moriya
Estimating the term…
A plate inspection system and a plate inspection method with which irregularities in phase difference caused in a retardation layer can be efficiently detected. The inspection system is for inspecting a plate to be inspected having a retardation layer 3. The plate inspection system comprises a polarized-light source for irradiating a polarized light 50 and an observation-side polarizer 20 placed on the observation side. In the inspection system, a plate to be inspected is placed between the polarized-light source 50 and the observation-side polarizer 20 so that the plate to be inspected is irradiated with polarized light from the polarized-light source 50. The position of at least the observation-side polarizer 20 or the plate to be inspected is changeable relative to the polarized-light source 50.
A plate inspection system for use in the inspection of a plate having a retardation layer, comprising:
A plate inspection method for inspecting a plate by the use of an inspection system for use in the inspection of a plate having a retardation layer, comprising a polarized-light source for irradiating a polarized light and an observation-side polarizer placed on the observation side,
A plate inspection method for inspecting a plate by the use of an inspection system for use in the inspection of a plate composed of a color filter having a retardation layer and color pixels of at least one of red, green and blue, the system comprising a polarized-light source for irradiating a polarized light and an observation-side polarizer placed on the observation side,
Dependencies are inferred from the claim text.