US 2009/0153714 A1 · Method for resetting time-based CMOS image sensor

Abstract

A method of resetting a time-based CMOS image sensor may be provided, where the time-based CMOS image sensor may include a photodiode, a transfer transistor transferring photo-generated charges generated in the photodiode to a floating diffusion node and having a gate to which a ramp signal is input, and a reset transistor resetting the photodiode and the floating diffusion node. The method may include generating photo-generated charges at the photodiode, transferring the photo-generated charges to the floating diffusion node in response to a ramp signal; and resetting a reset electron potential of the photodiode to be higher than a reset electron potential of the floating diffusion node.

Claims17

Dependent claims

A method of resetting a time-based CMOS image sensor, the time-based CMOS image sensor including a photodiode, a transfer transistor transferring photo-generated charges generated in the photodiode to a floating diffusion node and having a gate to which a ramp signal is input, and a reset transistor resetting the photodiode and the floating diffusion node, the method comprising:

generating photo-generated charges at the photodiode;
transferring the photo-generated charges to the floating diffusion node in response to a ramp signal;
and
resetting a reset electron potential of the photodiode to be higher than a reset electron potential of the floating diffusion node.

1 more element

Dependencies are inferred from the claim text.

Facts

Application

12/314,215Filed 5 Dec 2008

Priority

KR 10-2007-012980913 Dec 2007

Published

18 Jun 2009

Term ends

Not estimatedThe source records don’t support an estimate.

Classification6 codes

H04N 25/616
Noise processing, e.g. detecting, correcting, reducing or removing noise: involving a correlated sampling function, e.g. correlated double…
H04N 25/65
Noise processing, e.g. detecting, correcting, reducing or removing noise: applied to reset noise, e.g. KTC noise related to CMOS structures by…
H04N 25/671
Applied to fixed-pattern noise, e.g. non-uniformity of response: for non-uniformity detection or correction
H04N 25/77
Addressed sensors, e.g. MOS or CMOS sensors: pixel circuitry, e.g. memories, A/D converters, pixel amplifiers, shared circuits or shared components

Abstract

Facts

Application

12/314,215Filed 5 Dec 2008

Priority

KR 10-2007-012980913 Dec 2007

Published

18 Jun 2009

Term ends

Not estimatedThe source records don’t support an estimate.

Classification6 codes

H04N 25/616
Noise processing, e.g. detecting, correcting, reducing or removing noise: involving a correlated sampling function, e.g. correlated double…
H04N 25/65
Noise processing, e.g. detecting, correcting, reducing or removing noise: applied to reset noise, e.g. KTC noise related to CMOS structures by…
H04N 25/671
Applied to fixed-pattern noise, e.g. non-uniformity of response: for non-uniformity detection or correction
H04N 25/77
Addressed sensors, e.g. MOS or CMOS sensors: pixel circuitry, e.g. memories, A/D converters, pixel amplifiers, shared circuits or shared components

Method for resetting time-based CMOS image sensor

Life of this patent

Abstract

Claims17

Method for resetting time-based CMOS image sensor

Life of this patent

Abstract

Claims17