Microwave datum tool
AssigneeWalleye Technologies, Inc.
InventorsDavid S. Holbrook, Christopher P. Adams
Life of this patent
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AssigneeWalleye Technologies, Inc.
InventorsDavid S. Holbrook, Christopher P. Adams
Estimating the term…
In one aspect, a measurement system is disclosed that includes a source of microwave radiation having one or more wavelengths capable of penetrating through a visibly opaque obstruction, e.g., a wall. The source can be movably positioned on one side of the obstruction for illuminating thereof. The system can further include a microwave reflecting element disposed on another side of the obstruction, where the reflecting element is capable of reflecting at least a portion of the radiation transmitted through the obstruction. A plurality of radiation sensors are positioned relative to the obstruction so as to differentially detect at least a portion of the reflected radiation transmitted through the obstruction so as to determine a position of the source relative to the reflective element.
A measurement system, comprising
A measurement system, comprising
A measurement method, comprising
A measurement system, comprising
A measurement method, comprising
Dependencies are inferred from the claim text.