Structure for improving fuse state detection and yield in semiconductor applications

A design structure embodied in a machine readable medium, the design structure comprising an apparatus comprising:

• a first current source adapted to produce a first current;
• a second current source adapted to produce a second current, wherein said first current source and said second current source are configured so that said first current is less than said second current;
• a difference detection device with a first input and a second input;
• at least one first fuse electrically connected in series between said first current source and said first input so that said first current flows through said at least one first fuse to said first input;
• and
• at least one second fuse electrically connected in series between said second current source and said second input so that said second current flows through said at least one second fuse to said second input;
• wherein said at least one first fuse and said at least one second fuse are identical, and
• wherein said difference detection device is adapted to sense a first voltage of said first current at said first input, to sense a second voltage of said second current at said second input and to compare said first voltage to said second voltage in order to determine if said at least one first fuse has been blown.