Method for transferring test trays in a side-docking type test handler
AssigneeTechwing Co., Ltd.
InventorsJae Gyun SHIM, Yun Sung NA, In Gu JEON, Tae Hung KU, Dong Han KIM
Life of this patent
Estimating the term…
Abstract
The present invention relates to a test tray for a test handler. According to this invention, there is disclosed a technique that an insert loaded in a loading part which is arranged in a matrix pattern in a frame of the test tray allows an amount and direction of free movement thereof to be determined in accordance with a location of the loading part, where the insert is loaded, on the matrix, thereby enabling a thermal expansion or contraction of a match plate or the test tray to be compensated.
Claims11
A method for transferring test trays in a side-docking type test handler, the method comprising the steps of:
- (a) transferring a test tray in a horizontal posture from a loading unit to a test chamber via a soak chamber after semiconductor devices are loaded there on, wherein the horizontal posture of the test tray is changed to a vertical posture at a point while it is transferred;
- (b) vertically arranging in three rows three test trays sequentially transferred to the test chamber in the step (a);
- (c) transferring the three test trays vertically arranged in the three rows in the step (b) to a test position;
- (d) transferring each of the three test trays from the test chamber to an unloading unit via a desoak chamber after a test for semiconductor devices loaded on the three test trays is completed, wherein the vertical posture of the test tray is changed to the horizontal posture at a point while it is transferred;
- and
- (e) transferring each of the test trays transferred to the unloading unit in the step (d) to the loading unit after the semiconductor devices are unloaded therefrom.
Dependencies are inferred from the claim text.