Electronic device test apparatus and method of setting an optimum pushing condition for contact arm of electronic device test apparatus

An electronic device test apparatus for bringing a device under test into electrical contact with a socket in order to test electrical characteristics of the device under test, comprising:

• a contact arm moving the device under test in a vertical direction relative to the socket and pushing the device under test against the socket;
• a control device configured to control the movement operation of the contact arm;
• an instructing device configured to instruct the control device on the torque of the contact arm when pushing the device under test against the socket;
• an acquiring device configured to acquire from a tester the result whose the test of the device under test is executed when the contact arm pushes the device under test against the socket according to the torque instructed by the instructing device;
• a correcting device configured to correct the torque on which the instructing device instructs the control device on the basis of the test result acquired by the acquiring device;
• and
• a setting device configured to set the pushing condition of the contact arm at the time of a test where the test result is normal as an optimum pushing condition used at an actual test, if the torque was not corrected by the correcting device.