Inspection apparatus
AssigneeTokyo Electron Limited
InventorJunichi HAGIHARA
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AssigneeTokyo Electron Limited
InventorJunichi HAGIHARA
Estimating the term…
An inspection apparatus includes a movable mounting table having a temperature control device, an elevation drive unit for vertically moving the mounting table, a controller for controlling the elevation drive unit and a probe card having probes arranged above the mounting table. The elevation drive unit includes first and second driving shafts connected to each other through coupling members to drive the mounting table, a motor for driving the first and second driving shafts, and a torque detection unit for detecting a torque between the first and second driving shafts based on a contact load between the probes and the at least one device. The controller includes a torque controller for controlling the torque based on detection results of the torque detection unit when the probe card expands or contracts due to temperature variation.
An inspection apparatus which includes a movable mounting table having a temperature control device, an elevation drive unit for vertically moving the mounting table, a controller for controlling the elevation drive unit and a probe card having probes arranged above the mounting table, wherein an object to be inspected mounted on the mounting table is heated or cooled to a predetermined temperature through the temperature control device, and at least one device among devices formed in the object is made to be in electrical contact with the probes of the probe card with a specific contact load to inspect electrical characteristics of the device, the inspection apparatus comprising:
Dependencies are inferred from the claim text.