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US 2009/0153169 A1Published application
Probe having a field-replaceable tip
AssigneeSamtec, Inc.
InventorsEmad SOUBH, Doug McCARTIN, Jeremy WOOLDRIDGE, Steve KOOPMAN
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Abstract
A probe is provided for testing the electrical characteristics of a device. The probe includes a housing, a plurality of cables, a circuit board located within the housing, and a field-replaceable probe tip. The probe tip includes an array of contacts. Each of the plurality of cables is connected to a corresponding contact. The probe includes a retractable shroud that retracts as the probe is connected to the device. The contacts have bifurcated tips.
Claims5
An alignment assembly for aligning a probe with respect to a device to be tested comprising:
- a first alignment block;
- a second alignment block;
- and
- an alignment piece connecting the first alignment block and the second alignment block;
- wherein
- the first alignment block and the second alignment block are used to align the probe with respect to the device to be tested.
3 more elements
Dependencies are inferred from the claim text.