Back to results
US 2009/0153161 A1Published application
Probe Holder and Probe Unit
OwnerKoji Ishikawa, Jun Tominaga +1inventors
InventorsKoji Ishikawa, Jun Tominaga, Taiichi Rikimaru
Life of this patent
Estimating the term…
Abstract
A probe holder is for containing a plurality of probes for inputting and outputting an electrical signal to and from a circuitry when the probes come in contact with the circuitry. The probe holder includes a distal end for holding the probes; a proximal end that supports the distal end; and a flexure-causing unit between the distal end and the proximal end to cause a flexure of the distal end relative to the proximal end.
Claims9
1:
- A probe holder for containing a plurality of probes for inputting and outputting an electrical signal to and from a circuitry when the probes come in contact with the circuitry, the probe holder comprising:
- a distal end for holding the probes;
- a proximal end that supports the distal end;
- and
- a flexure-causing unit between the distal end and the proximal end to cause a flexure of the distal end relative to the proximal end.
2 more elements
2:
- The probe holder according to claim 1, wherein the flexure-causing unit has at least a portion formed integrally with the distal end and the proximal end and having a beam shape with a thickness smaller than thicknesses of the distal end and the proximal end.
3:
- The probe holder according to claim 1, wherein the flexure-causing unit includes an elastic member that connects the distal end and the proximal end.
4:
- The probe holder according to claim 3, wherein the elastic member includes at least one spring plate.
5:
- A probe unit comprising:
- a plurality of probes for inputting and outputting an electrical signal to and from a circuitry when the probes come in contact with the circuitry;
- and
- a probe holder including a distal end for holding the probes, a proximal end that supports the distal end, and a flexure-causing unit between the distal end and the proximal end to cause a flexure of the distal end relative to the proximal end.
1 more element
6:
- The probe unit according to claim 5, wherein the flexure-causing unit has at least a portion formed integrally with the distal end and the proximal end and having a beam shape with a thickness smaller than thicknesses of the distal end and the proximal end.
7:
- The probe unit according to claim 5, wherein the flexure-causing unit includes an elastic member that connects the distal end and the proximal end.
8:
- The probe unit according to claim 7, wherein the elastic member includes at least one spring plate.
9:
- The probe unit according to claim 5, wherein the probes include wiring formed on a surface of a sheet-like base, and a contact section arranged on one end of the wiring and coming into direct contact with the circuitry.