Circuit board test clamp
AssigneesHONG FU JIN PRECISION INDUSTRY (ShenZhen) CO., LTD., Hon Hai Precision Industry Co., Ltd.
InventorFA-SHENG HUANG
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Abstract
A circuit board test clamp is configured to test a circuit board via a tester having a probe. The circuit board test clamp includes a clamping element configured to clamp on the circuit board and a testing element mounted on the clamping element. The testing element includes a first test probe and a second test probe. When the circuit board is clamped by the clamping element, the first test probe electrically contacts a test point of the circuit board, and the second test probe is electrically connected to the probe of the tester.
Claims8
A circuit board test clamp comprising:
- a clamping element configured to clamp on one side of a circuit board;
- and
- a testing element mounted on the clamping element, the testing element comprising a first test probe and a second test probe electrically connected to the first test probe, when the clamping element clamps on the one side of the circuit board, the first test probe is capable of selectively electrically contacting one or more test points of the circuit board, and the second test probe is capable of being electrically connected to a test probe of a tester, such that the test points of the circuit board are capable of being selectively electrically connected to the test probe of the tester via the testing element.
Dependencies are inferred from the claim text.