Plasma processing apparatus and method thereof
AssigneesTokyo Electron Limited, Tohoku University
InventorsTakahiro Horiguchi, Shinsuke Oka, Masaki Hirayama
Life of this patent
Estimating the term…
Loading patent…
AssigneesTokyo Electron Limited, Tohoku University
InventorsTakahiro Horiguchi, Shinsuke Oka, Masaki Hirayama
Estimating the term…
[Problem] To provide a plasma processing apparatus and a method thereof, which is capable of generating plasma evenly on the lower surface of a dielectric. [Means for Solving] A plasma processing apparatus 1, in which microwave is propagated into a dielectric 32 provided on an upper surface of a processing chamber 4 via plural slots 70 formed on a lower surface of a waveguide 35 and a processing gas supplied in the processing chamber 4 is made into plasma using electric field energy of an electromagnetic field formed on the surface of the dielectric to perform plasma processing on a substrate G. The plasma processing apparatus 1, concave portions 80a to 80g having different depth are formed on a lower surface of dielectric 32. Further, the depths of the respective concave portions 80a to 80g are made different to control a plasma generation on the lower surface of the dielectric 32.
A plasma processing apparatus performing plasma processing on a substrate, wherein
A plasma processing method performing plasma processing on a substrate, wherein
Dependencies are inferred from the claim text.