Test piece magazine, magazine holder, and test piece attachment apparatus
AssigneeSousei Electronics Corporation
InventorRintaro Nishina
Life of this patent
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AssigneeSousei Electronics Corporation
InventorRintaro Nishina
Estimating the term…
A test piece attachment apparatus includes a test piece magazine having an inner space storing a plurality of specimen component test pieces aligned in a predetermined direction and a feed outlet via which the specimen component test pieces can be successively extruded, a magazine holder exchangeably holding the test piece magazine, a torsion spring generating a bias force to press the specimen component test pieces aligned in the test piece magazine toward the feed outlet, and a cylindrical casing. The cylindrical casing includes a recessed groove that allows the magazine holder to move in its axial direction and an extrusion projection disposed at a position where the extrusion projection can push one specimen component test piece positioned at the feed outlet and can extrude the specimen component test piece out of the test piece magazine in accordance with a movement of the magazine holder.
A test piece magazine capable of storing a plurality of specimen component test pieces aligned in a predetermined direction under an external bias force and extruding a specimen component test piece via a feed outlet under an external extrusion force, comprising:
A magazine holder configured to exchangeably hold a test piece magazine that can store a plurality of specimen component test pieces aligned in a predetermined direction under an external bias force, comprising:
A test piece attachment apparatus operable to attach a specimen component test piece to a portable specimen analyzer that has a distal end portion configured into a test piece holding portion for holding the specimen component test piece, the test piece attachment apparatus comprising:
A test piece attachment apparatus operable to attach a specimen component test piece to a portable specimen analyzer that has a distal end portion configured into a test piece holding portion for holding the specimen component test piece, the test piece attachment apparatus comprising:
Dependencies are inferred from the claim text.