Apparatus and method using a disk drive slider and/or a peltier plate in an atomic force microscope
AssigneeSamsung Electronics Co., Ltd.
InventorsDongman Kim, Michael Sullivan, Keung Youn Cho
Life of this patent
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Abstract
An Atomic Force Microscope (AFM) using a cantilevered probe containing a slider of a kind useable in a disk drive. The AFM may use a test surface similar to a disk surface in the disk drive and measure friction, lubricant depletion, and/or scratch test in the AFM to estimate the same under conditions experienced in the disk drive. The AFM may also include a Peltier plate thermally coupled to test object to maintain test surface at controlled test temperature. Refinements of the measurements are disclosed.
Claims22
An atomic force microscope, comprising:
- a positioning mechanism coupled to a test stand and configured to position a cantilevered probe over a test surface, said cantilevered probe including a cantilever coupled to a slider of a kind useable in a disk drive.
An atomic force microscope, comprising:
- a Peltier plate mounted on a test stand and configured to thermally couple to a test object, said Peltier plate being configured to maintain said test surface of said test object at a controlled test temperature.
A method, comprising the step of:
- operating an atomic force microscope with a cantilevered probe containing a slider of a kind useable in a disk drive, said slider positioned over a test surface to create a measurement of a friction-adhesion to estimate said friction-adhesion of said slider over a disk surface in said disk drive, whereby said test surface is similar to said disk surface.
A method, comprising the step of:
- operating an atomic force microscope with a cantilevered probe containing a slider of a kind useable in a disk drive, said slider positioned over a test surface to create a measurement of a lubricant depletion to estimate said lubricant depletion of said slider over a disk surface in said disk drive, wherein said test surface is similar to said disk surface.
A method, comprising the step of:
- operating said atomic force microscope with said cantilevered probe containing a slider of a kind useable in a disk drive and stimulating a vertical micro-actuator to create a measurement of a scratch test to estimate said scratch test of said slider on a disk surface in said disk drive, wherein said test surface is similar to said disk surface.
A method, comprising the step of:
- operating a Peltier plate thermally coupled to a test object including a test surface to create a test surface at a controlled test temperature in an atomic force microscope.
A cantilevered probe, comprising a cantilever coupled to a slider of a kind useable in a disk drive, and said cantilever configured for use in an atomic force microscope.
Dependencies are inferred from the claim text.