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US 2009/0151182 A1Published application
Measuring device
AssigneesHONG FU JIN PRECISION INDUSTRY (ShenZhen) CO., LTD., Hon Hai Precision Industry Co., Ltd.
InventorsChih-Kuang Chang, Sen Zhang, Jin-Kui Zeng
Life of this patent
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Abstract
A measuring device, includes a guiding rail, a sliding unit levitatedly slidably engaged with the guiding rail, and a measuring unit fixed to the sliding unit and comprising at least one clock gauge mounted thereto.
Claims14
A measuring device comprising:
- a guiding rail;
- a sliding unit levitatedly slidably engaged with the guiding rail;
- and
- a measuring unit fixed to the sliding unit and comprising at least one probe mounted thereto.
1 more element
A measuring device for detecting parallelism of an object to be measured, the measuring device comprising:
- a guiding rail, wherein linearity of a working face of the guiding rail is limited to be within 0.003 mm;
- a sliding unit levitatedly slidably engaged with the guiding rail;
- and
- a measuring unit fixed to the sliding unit and comprising at least one probe mounted thereto for detecting the parallelism between the object and the working face of the guiding rail.
1 more element
Dependencies are inferred from the claim text.