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AssigneeMathStar, Inc.
InventorsRichard D. Reohr, JR., Matthew F. Barr, Richard David Wiita
Estimating the term…
A field programmable object array integrated circuit has built-in self-testing capability. The integrated circuit comprises an array of programmable objects, a plurality of interfaces, and a controller. The array of objects is designed to operate at an operational clock speed during non-testing operation, wherein the design of the objects is not constrained to require within an object extra circuitry not essential to non-testing operation to facilitate built-in self-testing. The interfaces are connected to the objects to enable communication with the objects and to thereby facilitate built-in self-testing of the objects. The controller causes a selected subset of the objects to be activated and configured for testing, to stimulate the selected subset for some time with an input test pattern delivered via the interfaces while the selected subset of objects operates at the operational clock speed, and to observe a response of the selected subset of objects.
An integrated circuit with built-in self-testing capability, the integrated circuit comprising:
An integrated circuit as set forth in claim 17 wherein the selected subset of objects is a set of contiguous objects in a rectangle-shaped pattern.
A method of testing an integrated circuit comprising in substantial part an array of objects in a central region of the integrated circuit and further comprising registers outside of the central region, the method comprising:
A method of testing an integrated circuit comprising an array of objects, the method comprising:
Dependencies are inferred from the claim text.