Method for monitoring an internal control signal of a memory device and apparatus therefor
AssigneeHynix Semiconductor Inc.
InventorsJi Hyun KIM, Young Jun NAM
Life of this patent
Estimating the term…
Loading patent…
AssigneeHynix Semiconductor Inc.
InventorsJi Hyun KIM, Young Jun NAM
Estimating the term…
Disclosed is a method for monitoring an internal control signal of a memory device and an apparatus therefore. The method includes (a) generating a first signal having a first pulse width by a burst operation command, (b) receiving the first signal, and generating N−1 (where, N is a burst length) second signals having a second pulse width, (c) receiving the first signal and the second signals, and outputting a third signal by changing the first pulse width of the first signal and the second pulse width of the second signals in accordance with a variation of a frequency of a clock signal of the memory device, (d) outputting the third signal to an external pin of the memory device and monitoring the third signal, and (e) adjusting a pulse width of a signal that controls an operation of a data bus connecting a bit-line sense amplifier and a data sense amplifier using the third signal.
A method for monitoring an internal control signal of a memory device, comprising the steps of:
An apparatus for monitoring an internal control signal of a memory device, comprising:
A method for monitoring an internal control signal of a memory device, comprising the steps of:
Dependencies are inferred from the claim text.