Method and System for GRR Testing

A test system comprising:

• a controller communicatively coupled to a handler;
• an IC tester communicatively coupled to the controller, the IC tester being configured to test a semiconductor device in a plurality of positions;
• and
• a handler communicatively coupled to at least one of the controller and the IC tester, at least one of the controller and IC tester providing instructions to the handler to automatically retrieve each of a plurality of semiconductor devices for testing by the IC tester in each available position.

A computer program product for testing a plurality of semiconductor devices, the computer program product having a medium with a computer program embodied thereon, the computer program product comprising:

• (A) computer program code for causing a handler to move a first set of the semiconductor devices from a first arrangement at a first location to a second arrangement at a second location, the second location having a plurality of test sites;
• (B) computer program code for removing the first set of semiconductor devices from the second location and replacing the first set of semiconductor devices in the second location;
• (C) computer program code for moving the first set of semiconductor devices from the second arrangement to a third arrangement at the second location;
• and
• (D) computer program code for repeating (B)-(C) until each of the first set of semiconductor devices have been tested in each of the plurality of test sites.