Method of producing bonded wafer
AssigneeSumco Corporation
InventorsHideki NISHIHATA, Nobuyuki MORIMOTO, Akihiko ENDO
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Abstract
There is provided a method of producing a bonded wafer by bonding two silicon wafers for active layer and support layer to each other and then thinning the wafer for active layer, in which nitrogen ions are implanted from the surface of the wafer for active layer to form a nitride layer in the interior of the wafer for active layer before the bonding.
Claims9
(canceled)
A method of producing a bonded wafer by bonding two silicon wafers for active layer and support layer to each other and then thinning the wafer for active layer, in which the wafer for active layer is subjected to a nitriding heat treatment to form a nitride layer on the surface of the wafer for active layer before the bonding.
Dependencies are inferred from the claim text.