US 2009/0022406 A1Published application

Method for finding specific pattern and method for compensating image offset

AssigneeASUSTeK COMPUTER INC.

InventorsChung-Hwa Chang, Hsin-Ching Su

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Abstract

A method for finding a specific pattern is used to find a specific pattern in an image to be tested. The method comprises the following steps of: acquiring an image to be tested; performing a binary thresholding process on the image to be tested, thereby transforming the image to be tested into a binary image; performing a mosaic process on the binary image, thereby transforming the binary image into a mosaic image; utilizing a correlation coefficient method to find the specific pattern most similar to an image template from the mosaic image, wherein the image template is a desired mosaic pattern of the specific pattern; and transforming the mosaic image back into the binary image so as to find the coordinate of the specific pattern accurately.

Claims15

Dependent claims

A method for finding a specific pattern, the method being utilized for finding a center coordinate of a circle pattern within an image to be tested, comprising the steps of:

(i) capturing said image to be tested;
(ii) performing a binary thresholding process on said image to be tested, thereby transforming said image to be tested into a binary image;
(iii) performing a mosaic process on said binary image, thereby transforming said binary image into a mosaic image;
(iv) utilizing a correlation coefficient method to find said circle pattern most similar to an image template from said mosaic image, wherein said image template is a desired mosaic pattern of said circle pattern;
(v) acquiring an approximate coordinate of said circle pattern;
(vi) transforming said mosaic image back into said binary image;
(vii) acquiring a plurality of boundary coordinates x1, x2, y1 and y2 of said circle pattern respectively by using said approximate coordinate of said circle pattern as an initial point of a X-Y coordinate system to extend along a X-axis and a Y-axis;
and
(viii) setting said center coordinate of said circle pattern as
(
x
1
+
x
2
2
,
y
1
+
y
2
2
)
.

22 more elements

A method for compensating an image offset, the method being utilized for compensating offset of an image to be tested that includes a circle pattern implemented to assist positioning, comprising the steps of:

(i) setting a standard center coordinate of said circle pattern;
(ii) capturing said image to be tested;
(iii) performing a binary thresholding process on said image to be tested, thereby transforming said image to be tested into a binary image;
(iv) performing a mosaic process on said binary image, thereby transforming said binary image into a mosaic image;
(v) utilizing a correlation coefficient method to find said circle pattern most similar to an image template from said mosaic image, wherein said image template is a desired mosaic pattern of said circle pattern;
(vi) acquiring an approximate coordinate of said circle pattern;
(vii) transforming said mosaic image back into said binary image;
(viii) acquiring a plurality of boundary coordinates x1, x2, y1 and y2 of said circle pattern respectively by using said approximate coordinate of said circle pattern as an initial point of a X-Y coordinate system to extend along a X-axis and a Y-axis;
(ix) setting a center coordinate of said circle pattern as
(
x
1
+
x
2
2
,
y
1
+
y
2
2
)
;
(x) acquiring an offset amount between said standard center coordinate and said center coordinate of said circle pattern;
and
(xi) re-positioning said image to be tested by using said offset amount as a position compensation value.

25 more elements

Dependencies are inferred from the claim text.