Structure for a Phase Locked Loop with Adjustable Voltage Based on Temperature

A design structure encoded on a machine-readable data storage medium, said design structure comprising elements that when processed in a computer-aided design system generates a machine-executable representation of a phase locked loop circuit, wherein said design structure comprises:

• one or more first design structure elements representing one or more thermal sensors provided on an integrated circuit device;
• a second design structure element representing a thermal monitoring mechanism coupled to the one or more thermal sensors;
• and
• a third design structure element representing a phase locked loop (PLL) circuit coupled to the thermal monitoring mechanism, wherein the one or more thermal sensors are configured for use in controlling an operation of the integrated circuit device and an operation of the PLL circuit, and wherein the design structure is configured such that:
• a fourth design structure element representing an operational temperature of the integrated circuit device associated with the PLL circuit is sensed with the one or more thermal sensors provided on the integrated circuit device, and
• a fifth design structure element representing an operation of the PLL circuit is controlled based on the operational temperature sensed by the one or more thermal sensors.

A hardware description language (HDL) design structure encoded on a machine-readable data storage medium, said HDL design structure comprising elements that when processed in a computer-aided design system generates a machine-executable representation of a phase locked loop circuit, wherein said HDL design structure comprises:

• one or more first design structure elements representing one or more thermal sensors provided on an integrated circuit device;
• a second design structure element representing a thermal monitoring mechanism coupled to the one or more thermal sensors;
• and
• a third design structure element representing a phase locked loop (PLL) circuit coupled to the thermal monitoring mechanism, wherein the one or more thermal sensors are configured for use in controlling an operation of the integrated circuit device and an operation of the PLL circuit, and wherein the design structure is configured such that:
• an operational temperature of the integrated circuit device associated with the PLL circuit is sensed with the one or more thermal sensors provided on the integrated circuit device, and
• an operation of the PLL circuit is controlled based on the operational temperature sensed by the one or more thermal sensors.

A method in a computer-aided design system for generating a functional design model of a duty cycle correction circuit, said method comprising:

• generating a functional computer-simulated representation of one or more thermal sensors provided on an integrated circuit device;
• generating a functional computer-simulated representation of a thermal monitoring mechanism coupled to the one or more thermal sensors;
• and
• generating a functional computer-simulated representation of a phase locked loop (PLL) circuit coupled to the thermal monitoring mechanism, wherein the one or more thermal sensors are configured for use in controlling an operation of the integrated circuit device and an operation of the PLL circuit, and wherein the design structure is configured such that:
• an operational temperature of the integrated circuit device associated with the PLL circuit is sensed with the one or more thermal sensors provided on the integrated circuit device, and
• an operation of the PLL circuit is controlled based on the operational temperature sensed by the one or more thermal sensors.