Reliable level shifter of ultra-high voltage device used in low power application
AssigneeChartered Semiconductor Manufacturing Ltd.
InventorsHung Chang YU, Fei XU, Liang Choo HSIA
Life of this patent
Estimating the term…
Abstract
The present invention relates to integrated circuits. In particular, it relates to an IC comprising a receiving stage for receiving an input signal, an output stage for generating an output signal having a larger voltage range than the input signal and a level shifter. Embodiments of the invention provide a structure and a method for fabricating the IC wherein the level shifter is incorporated within the IC to improve reliability of the IC.
Claims21
An integrated circuit (IC) comprising:
- an input stage for receiving an input signal Vin;
- and
- an output stage coupled to the input stage, the output stage generates an output signal Vout;
- wherein the input stage comprises
- a first stage and the first stage is coupled to a high voltage source VH;
- a second stage coupled to the first stage;
- and
- a third stage coupled to the second stage, the third stage receiving Vin,
- wherein the second stage reduces a magnitude of VH to improve reliability.
A level shifter comprising:
- a first stage coupled to a high voltage source VH, the first stage comprises first transistors and the first transistors comprise high voltage transistors;
- a second stage coupled to the first stage, the second stage comprises second transistors;
- a third stage coupled to the second stage for receiving an input signal Vin, the third stage comprises third transistors and the third transistors comprise low voltage transistors, wherein the second stage reduces a magnitude of VH to improve reliability.
A method of forming an integrated circuit (IC), the method comprising the steps of:
- providing an input stage for receiving an input signal Vin;
- and
- providing an output stage for generating an output signal Vout, said output stage being coupled to the input stage;
- wherein the input stage comprises
- a first stage coupled to a high voltage source VH;
- a second stage coupled to the first stage;
- and
- a third stage coupled to the second stage, the third stage for receiving Vin,
- wherein the second stage reduces a magnitude of VH to improve reliability.
Dependencies are inferred from the claim text.