Method and arrangement for positioning a probe card

Method for positioning a probe card with probe needles, which needles have needle tips, relative to a surface of a substrate to be tested in a direction perpendicular to the surface of the substrate, a first position of the needle tips relative to the surface of the substrate being measured and stored as a separation position in such a manner that the separation point is approached in a first positioning step, which step does not measure the distance between the needle tips and the surface of the substrate, so as to produce a distance between the needle tips and the surface of the substrate, a second position of the needle tips relative to the surface of the substrate being measured and stored as a contact position in such a manner that the contact position is approached in a second positioning step, which second step does not measure the distance between the needle tips and the surface of the substrate, until the needle tips make contact with the surface of the substrate, an image of the needle tips being recorded along at least one horizontal imaging direction, which direction is essentially parallel to the surface of the substrate, and being displayed, and, when imaging the needle tips, the stored contact position is imaged or an absolute height of the needle tips which corresponds to the stored contact position is imaged, the imaged contact position or the imaged absolute height of the needle tips is changed until presentation of these positions corresponds to a height of the needle tips which is appropriate for the respective probe card or corresponds to an appropriate height of the contact position and this contact position which has been set is then stored as a new contact position or the corresponding contact position is calculated from set height of the contacts and is stored.