Current measuring apparatus, test appartaus, current measuring method and test method
AssigneeAdvantest Corporation
InventorYOSHIHIRO HASHIMOTO
Life of this patent
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AssigneeAdvantest Corporation
InventorYOSHIHIRO HASHIMOTO
Estimating the term…
There is provided a current measuring apparatus that measures an electric current received by an electronic device from an input terminal, The current measuring apparatus includes a first voltage accumulator that accumulates a reference supply voltage that acts as a reference for a voltage being supplied to the electronic device during measuring electric currents, a first switch that connects a power supply to the first voltage accumulator to accumulate the reference supply voltage before measuring electric currents and disconnects the power supply from the first voltage accumulator during measuring electric currents, a current supplying section that supplies an electric current based on the reference supply voltage accumulated in the first voltage accumulator and a terminal voltage of the input terminal to the electronic device during measuring electric currents, and a first current measuring section that measures the supply current supplied to the electronic device.
A current measuring apparatus that measures an electric current received by an electronic device from an input terminal, the current measuring apparatus comprising:
A test apparatus that tests an electronic device, comprising:
A current measuring method for measuring an electric current received by an electronic device from an input terminal, the current measuring apparatus comprising:
A test method for testing an electronic device, comprising:
Dependencies are inferred from the claim text.