Semi-generic in-circuit test fixture
OwnerMartin Blouininventor
Life of this patent
Estimating the term…
Abstract
A semi-generic test fixture for testing printed circuit boards (PCBs) and/or for testing printed circuit boards assemblies (PCBAs) is presented. The semi-generic test fixture implements a combination of generic and customized parts for tester-to-fixture interface instead of a static dedicated in-circuit test (ICT) fixture which is able to interconnect only one kind of unit under test (UUT) to an ICT tester test-head. The semi-generic ICT fixture (SGICTF) is able to interconnect an ICT test-head with a variety of UUT types with a minimum of adaptation. Accordingly, the SGICTF generally comprises two generic PCB connected to the tester and two customized PCB connected to the generic PCB and adapted to interface the particular UUT via testing probes.
Claims20
An in-circuit test fixture for providing an electronic interface between an in-circuit tester and a unit under test, said fixture comprising:
- a. a first plate provided with a plurality of holes for holding and guiding a first plurality of probes, said first plurality of probes being configured to contact first predetermined points on said unit under test;
- b. a first printed circuit board comprising a first plurality of pads aligned and connectable with said first plurality of probes, first connecting means and first traces for routing electronic signals between said first plurality of pads and said first connecting means;
- c. a second printed circuit board comprising second connecting means connectable to said first connecting means, third connecting means for connecting said second printed circuit board to said tester, and second traces for routing said electronic signals between said second connecting means and said third connecting means.
An in-circuit test fixture for providing an electronic interface between an in-circuit tester and a unit under test, said unit under test having a top side and an under side, said fixture comprising:
- a. a first plate provided with a plurality of holes for holding and guiding a first plurality of probes, said first plurality of probes being configured to contact first predetermined points on said under side of said unit under test;
- b. a first printed circuit board comprising a plurality of pads aligned and connectable with said first plurality of probes, first connecting means and first traces for routing electronic signals between said first plurality of pads and said first connecting means;
- c. a second printed circuit board comprising second connecting means connectable to said first connecting means, third connecting means for connecting said second printed circuit board to said tester, a first connector and second traces for routing said electronic signals between said second connecting means, said third connecting means and said first connector;
- d. a second plate provided with a plurality of holes for holding and guiding a second plurality of probes, said second plurality of probes being configured to contact second predetermined points on said top side of said unit under test;
- e. a third printed circuit board comprising a second plurality of pads aligned and connectable with said second plurality of probes, fourth connecting means and third traces for routing said electronic signals between said second plurality of pads and said fourth connecting means;
- f. a fourth printed circuit board comprising fifth connecting means connectable to said fourth connecting means, a second connector for connecting said fourth printed circuit board to said second printed circuit board via said first connector and fourth traces for routing said electronic signals between said fifth connecting means and said second connector.
An in-circuit test fixture for providing an electronic interface between an in-circuit tester and a unit under test, said fixture comprising:
- a. a plurality of probes configured to contact predetermined points on said unit under test;
- b. a first printed circuit board adapted to be in electronic communication with said probes, said first printed circuit board comprising first traces for routing electronic signals;
- c. a second printed circuit board adapted to be in electronic communication with said tester, said second printed circuit board comprising second traces for routing said electronic signals;
- wherein said first and second circuit boards are in electronic communication whereby said electronic signals can travel between said tester and said probes.
Dependencies are inferred from the claim text.