Method and device for regulating a voltage supply to a semiconductor device
OwnerAnton Rozen, Michael Priel +2inventors
InventorsAnton Rozen, Michael Priel, Leonid Smolyansky, Boris Bobrov
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Abstract
A device for regulating a voltage supply to a semiconductor device, the device comprising memory for storing a plurality of performance ranges, wherein the respective performance ranges are associated with a respective supply voltage; means for measuring the performance of the semiconductor device; and a regulator for modifying the supply voltage to the semiconductor device if the measured performance of the semiconductor device is not within a predetermined portion of the performance range associated with the voltage supplied to the semiconductor device.
Claims30
A device for regulating a voltage supply to a semiconductor device, said device comprising:
- a memory for storing a plurality of performance ranges, wherein said performance ranges are associated with a respective supply voltage;
- a measuring function for measuring a performance of said semiconductor device;
- and
- a regulator wherein the device is characterised in that the memory stores a performance limit of the semiconductor device and a reference circuit is coupled to the memory and is arranged to determine a lowest supply voltage required to maintain a performance of the semiconductor device at a given operational frequency and modify the supply voltage to said semiconductor device if a measured performance of said semiconductor device is not within a predetermined portion of said performance range associated with said voltage supplied to said semiconductor device.
A method for regulating a voltage supply to a semiconductor device, said method comprising:
- storing a plurality of performance ranges of the semiconductor device wherein respective performance ranges are associated with a respective supply voltage;
- measuring a performance of said semiconductor device;
- wherein the method is characterised by the step of determining a lowest supply voltage required to maintain a performance of the semiconductor device at a given operational frequency and modifying said supply voltage to said semiconductor device if a measured performance of said semiconductor device is not within a predetermined portion of a performance range associated with said voltage supplied to said semiconductor device.
A device for regulating a voltage supply to a semiconductor device, said device comprising:
- a memory for storing a plurality of process temperature compensation voltage values, wherein said respective process temperature compensation voltage values are associated with a respective operational frequency for said semiconductor device;
- and
- a regulator for modifying said supply voltage to said semiconductor device if said operational frequency of said semiconductor device changes to a new operational frequency, and wherein the device is characterised in that the memory stores a performance limit of the semiconductor device and a reference circuit is coupled to the memory and is arranged to determine a lowest supply voltage required to maintain a performance of the semiconductor device at a given operational frequency and modify said supply voltage to substantially a same value as said process temperature compensation voltage value associated with said new operational frequency,
A method for regulating a voltage supply to a semiconductor device, said method comprising.
- storing a plurality of process temperature compensation voltage values, wherein respective process temperature compensation voltage values are associated with a respective operational frequency for said semiconductor device;
- and
- modifying a supply voltage to said semiconductor device if an operational frequency of said semiconductor device changes to a new operational frequency, wherein the method is characterised by the step of determining a lowest supply voltage required to maintain a performance of the semiconductor device at a given operational frequency and modifying said supply voltage to substantially a same value as a process temperature compensation voltage value associated with said new operational frequency.
Dependencies are inferred from the claim text.