Specimen Holder for Electron Microscope
AssigneeJEOL Ltd.
InventorKoji Moriya
Life of this patent
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Abstract
The present invention provides a specimen holder for use with an electron microscope. The specimen holder has a retainer mounted at the front end of the body of the specimen holder. The retainer has a plate member provided with a hole around its front end. The hole provides a reference in securing the whole specimen for a desired field of view. A circular groove is formed in the plate member and used to place the specimen in position. Any members lying perpendicularly to the tilted axis at the position of the specimen are cut out.
Claims2
A specimen holder for use with an electron microscope and including a holder body having a specimen-holding portion formed at its front end,
- wherein said specimen-holding portion has a plate member provided with a hole to permit passage of an electron beam, and
- wherein a groove is formed around said hole in the plate member and is used to place the specimen in position, the groove having cutouts lying perpendicularly to a tilted axis of the specimen holder.
Dependencies are inferred from the claim text.