Defect inspecting method and device thereof
AssigneeDelta Electronics, Inc.
InventorsHsuan Yang, Shia-Chih Lai, Jia-Lin Shen
Life of this patent
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Abstract
A defect inspecting method is provided. The defect inspecting method for inspecting a defect information of a target device includes steps of retrieving one of a whole image and a part of image of the target device; setting a plurality of conditions for a defect recognizing scheme; adjusting the plurality of conditions by a manual scheme; adjusting the plurality of conditions based on the retrieved image; and implementing the defect recognizing scheme based on the adjusted plurality of conditions for inspecting the target device, so as to obtain the defect information of the target device is provided.
Claims18
A defect inspecting method for inspecting a defect information of a target device, comprising steps of:
- retrieving one of a whole image and a part of image of the target device;
- setting a plurality of conditions for a defect recognizing scheme;
- adjusting the plurality of conditions by a manual scheme;
- adjusting the plurality of conditions based on the retrieved image;
- and
- implementing the defect recognizing scheme based on the adjusted plurality of conditions for inspecting the target device, so as to obtain the defect information of the target device.
A condition adjusting method, for inspecting at least one standard device to obtain a plurality of conditions for a defect recognizing scheme, comprising steps of:
- retrieving one of a whole image and a part of image of the at least one standard device;
- adjusting the plurality of conditions based on the retrieved image;
- and
- adjusting the plurality of conditions by a manual scheme.
A defect inspecting device inspecting a defect information of a target device, comprising:
- a image retrieval device obtaining one of a whole image and a part of image of the target device;
- a calculating device connected with the image retrieval device, for providing a defect recognizing scheme and a plurality of conditions thereof, adjusting the plurality of conditions and inspecting the target device by the defect recognizing scheme based on the plurality of conditions, so that the defect information is obtained;
- and
- an output device connected with the calculating device, for outputting the defect information.
Dependencies are inferred from the claim text.