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AssigneeWaveFront Sciences, Inc.
InventorsC. David Baer, Daniel R. Neal, Richard James Copland, David Austin Neal
Estimating the term…
Systems and methods for measuring a distance from a reference plane of an optical measurement instrument to a reference plane of an optical device under test are disclose. In one embodiment a system for measuring this distance includes an illumination system, an optical system, and optical sensor and a processor. The illumination system is configured or adapted to illuminate the object under test. The optical system is configured or adapted to receive light from the object under test and to produce an aberrated image. The optical sensor is configured or adapted to receive and sense the aberrated image. The processor determines the distance from the reference plane of the optical measurement instrument to the reference plane of the optical device based on an aspect of the aberrated image sensed by the optical sensor.
A method of measuring a distance from a reference plane of an optical measurement instrument to a reference plane of an object under test, comprising:
A system for measuring a distance from a reference plane of an optical measurement instrument to a reference plane of an optical device under test, comprising:
A system for measuring a distance from a reference plane of an optical measurement instrument to a reference plane of an object under test comprising:
Dependencies are inferred from the claim text.