Back to results
US 2008/0290891 A1Published application
Method of performing parallel test on semiconductor devices by dividing voltage supply unit
AssigneeSamsung Electronics Co., Ltd.
InventorsSang-Hoon LEE, Joon-Su JI, Jung-Bae AHN
Life of this patent
Estimating the term…
Abstract
Provided is a method of performing a parallel test on semiconductor devices, the method including coupling a power signal line to a set of at least two semiconductor devices through a switching device, performing at least one part of a parallel test on the set of semiconductor devices, and disconnecting a semiconductor device from the set in response to determining that the semiconductor device is defective as a result of the at least one part of the parallel test.
Claims7
A method of performing a parallel test, the method comprising:
- performing at least one part of a parallel test on a plurality of sets of semiconductor devices, each set including at least two semiconductor devices;
- determining if at least one of the semiconductor devices of a set is defective as a result of the at least one part of the parallel test;
- and
- disconnecting the set with at least one defective semiconductor device from at least one power signal line.
1 more element
Dependencies are inferred from the claim text.