US 2008/0290890 A1 · TESTING SYSTEM FOR TESTING ELECTRONIC ASSEMBLY

Abstract

A testing system for testing performance of a number of image sensor modules includes a data transforms module, a number of selection switches and a testing processor. The data transform module has a pin assembly corresponding to the input/output pin assembly. The pin assembly includes a first pin and a second pin. The selection switches are configured for selecting the high level signal or the low level signal and providing the signal level to the control signal pins of the electronic assemblies. The testing processor is electronically connected to the data transform module and configured for processing data from the data transform module. In testing, the image sensor modules coupled together through a base do not need to be separated from each other, thus facilitating the next process. Therefore, the failure rate of the image sensor modules is decreased and cost is reduced.

Claims15

Dependent claims

A testing system for testing performance of a plurality of electronic assemblies, each of electronic assemblies having an input/output pin assembly that comprises a control signal pin, the testing system comprising:

a data transform module having a pin assembly respectively coupled to the input/output pin assembly, the pin assembly comprising a first pin configured for transmitting a high level signal and a second pin configured for transmitting a low level signal;
a plurality of selection switches respectively and electronically connected between the control signal pins of the electronic assemblies and the data transform module, the selection switch being configured for selecting the high level signal or the low level signal, and transmitting the selected signal to the control signal pin of a corresponding electronic assembly to activate or deactivate the corresponding electronic assembly;
and
a testing processor electronically connected to the data transform module and configured for processing data from the data transform module and transmitting electronic signals to the electronic assemblies via the data transform module.

1 more element

A testing system for testing performance of a plurality of image sensor modules mounted on a common base, each of image sensor modules having an input/output pin assembly that comprises a control signal pin, the testing system comprising:

a data transform module having a pin assembly respectively coupled to the input/output pin assembly, the pin assembly comprising a first pin configured for transmitting a high level signal and a second pin configured for transmitting a low level signal;
a plurality of selection switches respectively connected between the control signal pins of the image sensor modules and the data transform module configured to select one of the image sensor modules to be activated and the rest of the image sensor modules to be deactivated;
and
a testing processor electronically connected to the data transform module and configured to process data from the data transform module and determine whether the activated image sensor module meets predetermined test criteria.

1 more element

Dependencies are inferred from the claim text.

Testing system for testing electronic assembly

Life of this patent

Testing system for testing electronic assembly

Life of this patent

Abstract

Claims15