Method for manufacturing organic EL element
OwnerHirotaka Sone, Toshio Okuni +1inventors
InventorsHirotaka Sone, Toshio Okuni, Kimihiko Yoshino
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Abstract
A substrate mark is formed on a transparent substrate as an alignment mark. The substrate mark is formed at the same time as transparent electrodes are formed on the transparent substrate. The substrate mark is formed of the same material as the transparent electrodes. A center wavelength of a transmission wavelength of a plurality of optical filters is different from each other. An optical filter corresponding to a thickness of the substrate mark is selected from a plurality of optical filters. Light is irradiated from a white light source to the substrate mark via the selected optical filter. Accordingly, the substrate mark is recognized and a shadow mask is aligned with the transparent substrate.
Claims3
A method for manufacturing an organic EL element, comprising:
- forming transparent electrodes on a transparent substrate;
- forming a substrate mark on the transparent substrate as an alignment mark, the substrate mark being formed at the same time as the transparent electrodes are formed on the transparent substrate, and the substrate mark being formed of the same material as the transparent electrodes, and the substrate mark having a thickness;
- arranging the transparent substrate above a shadow mask so as to align the shadow mask with the transparent substrate;
- preparing a white light source and a plurality of optical filters, wherein a center wavelength of a transmission wavelength of each of the optical filters is different from each other;
- selecting an optical filter that corresponds to the thickness of the substrate mark from the optical filters;
- irradiating light from the white light source to the substrate mark via the selected optical filter, thereby aligning the shadow mask with the transparent substrate using the substrate mark;
- and
- laminating an organic EL layer on the transparent electrodes by deposition through the shadow mask.
Dependencies are inferred from the claim text.